关键词: 片式电阻, 硫化, 失效分析

Abstract: The abnormality of the resistance of the post-slice chip resistor is analyzed. The abnormality of chip resistors is due to the sulfuration phenomena at the chip resistor pad, which is confirmed by scanning electron microscopy and energy spectrum analysis. The sulfuration mechanism of chip resistors is studied, and several measures of the prevention from resistors sulfuration are provided.

Key words: Chip resistor, Sulfuration, Failure analysis