Abstract: As electronic devices become smaller, lighter, and more advanced, meanwhile its working environment even worse, the chance of silver ion migration is greater than ever before. This paper introduces the phenomenon and mechanism of silver ion migration, as well as various factors that affect the silver ion migration in detail, the time formula for a realistic accelerated test to evaluate silver ion migration is obtained, which effectively shortened the evaluation time. Based on the experience of the process of fault analysis and the conditions of silver ion migration, a strategy for taking measures in each step of silver ion migration is proposed, which prevents the occurrence of migration.

Key words: Silver ion migration, Accelerated test, Fault analysis, Prevent recurrence