关键词: MCU自检, 故障覆盖能力, 棋盘算法测试, 多模式组合测试

Abstract: With the rapid development of semiconductor technology and its application in home appliances, traditional home appliances are shifting from mechanical control to electronic control and intelligent control. Some risk functions in the operation of home appliances rely on software protection. As the core control unit, the reliability of the microcontroller unit (MCU) directly affects the stability of the entire system operation. Different institutions have different testing methods for the variable memory self-test (RAM) in B-class controllers. The fault coverage, real-time performance, and resource consumption of two self-test methods-Checkerboard memory test (0x55→0xAA→0x55) and multi-mode combination test (0x00→0x55→0x33→0x0F→0xFF) -are analyzed. By comparing the advantages and disadvantages, this paper proposes the advantages of chessboard algorithm testing in terms of efficiency and comprehensiveness in detection, and reveals the potential design flaws of multi-mode combination testing. The research results provide optimization directions for RAM self checking strategies in embedded systems and security critical fields.

Key words: MCU self-test, Fault coverage capability, Checkerboard memory test, Multi mode combination test